NI PXIE-4147测量单元模块 PDF资料
1.产 品 资 料 介 绍：
中文资料：
NI PXIe-4147 是由美国国家仪器（NI）推出的一款 4 通道精密 PXI 源测量单元（SMU），专为高引脚数应用设计。该模块具备四象限操作功能，每个通道集成了远程（4 线）传感，确保精确测量。
主要特点：
高通道密度：单个模块提供 4 个独立的 SMU 通道，适用于需要多通道同步测量的应用。
四象限操作：每个通道支持四象限运行，能够源出和吸收电流，满足各种测试需求。
高速采样率：高采样速率有助于缩短测量时间，捕获设备的瞬态特性，实现快速的 I-V 特性分析。
SourceAdapt 技术：可调整 PXIe-4147 对任何负载的响应，以获得最佳的稳定性和最小的瞬态特性。
确定性硬件序列：内置高速序列引擎，支持 SMU 之间或与其他仪器（如开关或高速数字测试模块）的同步操作。
技术规格：
电压范围：±8 V
直流电流范围：±3 A
电流灵敏度：100 fA
最大直流功率：24 W（源出/吸收）
PXIe-4147 适用于半导体器件测试、电子元件特性分析以及需要高精度、多通道电源和测量的其他应用。其模块化设计使其易于集成到现有的 PXI 测试系统中，提供灵活且高效的测试解决方案。
英文资料：
NI PXIe-4147 is a 4-channel precision PXI source measurement unit (SMU) developed by National Instruments (NI) in the United States, specifically designed for high pin count applications. This module has four quadrant operation function, and each channel integrates remote (4-wire) sensing to ensure accurate measurement.
Main features:
High channel density: A single module provides 4 independent SMU channels, suitable for applications that require multi-channel synchronous measurement.
Four quadrant operation: Each channel supports four quadrant operation, which can source and absorb current to meet various testing requirements.
High sampling rate: High sampling rate helps shorten measurement time, capture transient characteristics of the device, and achieve fast I-V characteristic analysis.
SourceAdapt technology: The response of PXIe-4147 to any load can be adjusted to achieve optimal stability and minimal transient characteristics.
Deterministic hardware sequence: Built in high-speed sequence engine, supporting synchronous operation between SMUs or with other instruments such as switches or high-speed digital testing modules.
Technical specifications:
Voltage range: ± 8 V
DC current range: ± 3 A
Current sensitivity: 100 fA
Maximum DC power: 24 W (source/absorption)
PXIe-4147 is suitable for semiconductor device testing, electronic component characteristic analysis, and other applications that require high-precision, multi-channel power supply and measurement. Its modular design makes it easy to integrate into existing PXI testing systems, providing flexible and efficient testing solutions.
2.产 品 展 示
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