AGILENT 5517C激光红色干涉仪 PDF资料
1.产 品 资 料 介 绍：
中文资料：
Agilent 5517C 激光红色干涉仪 是由 Agilent Technologies（安捷伦科技） 生产的一款高精度干涉仪，主要用于精密测量和表面形貌分析。Agillent 5517C 是干涉仪产品线中的一款高端型号，专为高精度光学干涉测量设计，适用于各种高精度测量领域，尤其是在科学研究、制造业、半导体制造和精密机械加工等领域具有重要应用。
主要特点：
高精度测量：
- Agilent 5517C 激光红色干涉仪使用激光干涉技术，提供纳米级的精度测量。其分辨率可以达到纳米级别，适用于对表面形貌、位移、振动等参数的精密测量。
- 通过干涉原理，能够精确测量物体表面的微小变化，例如厚度、形状、间隙、表面轮廓等。
激光源：
- 采用红色激光源（波长为 632.8 nm），该波长的激光具有高稳定性和精度，能够提供清晰、稳定的干涉条纹，进而确保测量结果的高准确性。
- 激光的使用可以提高系统的信号强度，保证在复杂的实验环境下仍能获得精确的测量结果。
干涉原理：
- 该仪器基于激光干涉原理工作。通过比较参考光束与测试物体反射光束的相位差，Agilent 5517C 可以精确地计算出物体表面或位移的微小变化。
- 干涉仪通过分析干涉条纹的变化，可以测量表面形貌、物体的运动或位移，适用于动态测量和静态测量。
适用领域：
- 光学表面测量：用于测量表面形貌，如平面度、表面粗糙度等。
- 位移与振动测量：适用于高精度位移测量和动态振动分析，常用于精密机械和自动化设备的测试。
- 微型组件与半导体测量：广泛应用于半导体制造中的微型元件和微结构的测量，确保产品的尺寸精度。
- 研究与开发：在科研领域，特别是物理学、材料科学和纳米技术的研究中，5517C 激光干涉仪可以提供准确的表面分析数据。
高稳定性与重复性：
- 该设备具备优异的稳定性，能够提供高重复性、低噪声的测量结果。即便在环境条件变化较大的情况下，仍然能够保持高精度。
用户友好的界面：
- Agilent 5517C 配备直观的操作界面，用户可以轻松设置和操作仪器，进行测量和数据分析。
- 提供各种数据输出格式，方便用户对测量结果进行记录、处理和进一步分析。
多种应用附件与功能：
- 该设备可与多种附件搭配使用，如光学反射镜、探测器、扫描平台等，以扩展其功能和应用范围。适用于不同的测量任务和工件尺寸。
- 还可以进行现场实时测量，适合在生产线或实验室环境中使用。
英文资料：
The Agilent 5517C laser red interferometer is a high-precision interferometer produced by Agilent Technologies, mainly used for precision measurement and surface morphology analysis. Agillent 5517C is a high-end model in the interferometer product line, designed specifically for high-precision optical interferometry measurement. It is suitable for various high-precision measurement fields, especially in scientific research, manufacturing, semiconductor manufacturing, and precision machining, and has important applications.
Main features:
High precision measurement:
The Agilent 5517C laser red interferometer uses laser interferometry technology to provide nanometer level precision measurements. Its resolution can reach the nanometer level, suitable for precise measurement of surface morphology, displacement, vibration and other parameters.
Through the principle of interference, it is possible to accurately measure small changes on the surface of an object, such as thickness, shape, gaps, surface contours, etc.
Laser source:
Using a red laser source (wavelength of 632.8 nm), this wavelength of laser has high stability and accuracy, providing clear and stable interference fringes to ensure high accuracy of measurement results.
The use of lasers can improve the signal strength of the system, ensuring accurate measurement results even in complex experimental environments.
Interference principle:
This instrument operates based on the principle of laser interference. By comparing the phase difference between the reference beam and the reflected beam of the test object, Agilent 5517C can accurately calculate small changes in the surface or displacement of the object.
Interferometers can measure surface morphology, object motion or displacement by analyzing the changes in interference fringes, and are suitable for dynamic and static measurements.
Applicable fields:
Optical surface measurement: used to measure surface morphology, such as flatness, surface roughness, etc.
Displacement and vibration measurement: suitable for high-precision displacement measurement and dynamic vibration analysis, commonly used for testing precision machinery and automation equipment.
Micro components and semiconductor measurement: widely used in the measurement of micro components and microstructures in semiconductor manufacturing to ensure the dimensional accuracy of products.
Research and development: In the field of scientific research, especially in physics, materials science, and nanotechnology, the 5517C laser interferometer can provide accurate surface analysis data.
High stability and repeatability:
This device has excellent stability and can provide measurement results with high repeatability and low noise. Even under significant changes in environmental conditions, high accuracy can still be maintained.
User friendly interface:
The Agilent 5517C is equipped with an intuitive user interface, allowing users to easily set up and operate the instrument for measurement and data analysis.
Provide various data output formats to facilitate users in recording, processing, and further analyzing measurement results.
Multiple application attachments and functions:
This device can be used in conjunction with various accessories, such as optical mirrors, detectors, scanning platforms, etc., to expand its functionality and application range. Suitable for different measurement tasks and workpiece sizes.
It can also perform real-time on-site measurements, suitable for use in production lines or laboratory environments.
2.产 品 展 示
3.其他产品
4.其他英文产品
GESVDU-1D-8946 Input/Output Module
ABB UN0807C-P Programmable Controller
| EP3620-4460-7-56C-CU | AMAT 0010-86037 | DSTC404 ABB |
| EP3620-1954-7-56BC-CU | AMAT 0100-09115 | 5736 045-N DSMD113 ABB |
| E10038-33VM61-030 | S60300-EI | IMASO11 |
| DVC 550 | CACR-SR05AB1ERY3-V | EPC-161316AE |
| DVC 310 | CACR-PR30BC3CSY166E | 48964402-D, |
| DS200SIOBH1A | 6DD1681-0DJ1 | ICS TRIPLEX TC-801-02- .4M5 |
| DS200DCFBG1BLC | CACR-SR30SZ1SDY230 | EXP-BP3A |
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